O. Polgár - Concepedia

Author

O. Polgár

Institute for Technical Physics and Materials Science

Also Known As

O Polgár, O. Polgar, O. Polgár, Oliver Polgar

Publications

491

Citations

H-Index

Concepts

All Affiliations

Institute for Technical Physics and Materials Science Hungarian Academy of Sciences Schott (Germany)Institute for Solid State Physics and Optics Centre National de la Recherche Scientifique

About

O. Polgár is an author at Institute for Technical Physics and Materials Science specializing in engineering, applied physics, and materials science.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	14	17	362
2	Applied Physics	13	17	337
3	Education	3	3	51
4	Health Sciences	1	1	26
5	Medicine	1	1	18

O. Polgár

Publications

427

Citations

H-Index

Page 1

	Year	Citations
Characterization of different porous silicon structures by spectroscopic ellipsometry M. Fried, T. Lohner, O. Polgár, Thin Solid Films Materials ScienceEngineeringSpectroscopySurface ScienceApplied Physics	1996	50
High-Speed Imaging/Mapping Spectroscopic Ellipsometry for In-Line Analysis of Roll-to-Roll Thin-Film Photovoltaics Ambalanath Shan, M. Fried, György Juhász, IEEE Journal of Photovoltaics Expanded Beam TechniqueLayer ThicknessElectrical EngineeringOrganic PhotonicsRoll-to-roll Thin-film Photovoltaics	2013	38
Comparison of algorithms used for evaluation of ellipsometric measurements random search, genetic algorithms, simulated annealing and hill climbing graph-searches O. Polgár, M. Fried, T. Lohner, Surface Science Search OptimizationEngineeringGenetic AlgorithmsMeasurementSimulated Annealing	2000	35
Ellipsometric characterization of damage profiles using an advanced optical model P. Petrík, O. Polgár, M. Fried, Journal of Applied Physics Optical MaterialsImpact (Mechanics)EngineeringOptical TestingMechanical Engineering	2003	31
Expanded beam (macro-imaging) ellipsometry M. Fried, Gergely Juhász, C. Major, Thin Solid Films Beam OpticMedical ImagingMicroscopyGeometrical OpticBiomedical Imaging	2010	26
Non‐collimated beam ellipsometry Gergely Juhász, Zoltán Horváth, C. Major, Physica status solidi. C, Conferences and critical reviews/Physica status solidi. C, Current topics in solid state physics Optical MaterialsEngineeringMeasurementMicroscopyOptical Testing	2008	25
Optimisation of porous silicon based passive optical elements by means of spectroscopic ellipsometry János Volk, M. Fried, O. Polgár, physica status solidi (a) Optical MaterialsEngineeringNanoporous MaterialOptical TestingOptoelectronic Devices	2003	18
Ellipsometric characterization of oxidized porous silicon layer structures T. Lohner, M. Fried, P. Petrík, Materials Science and Engineering B Materials ScienceSurface CharacterizationEngineeringSurface ScienceApplied Physics	2000	18
Dose-dependence of ion implantation-caused damage in silicon measured by ellipsometry and backscattering spectrometry M. Fried, P. Petrík, T. Lohner, Thin Solid Films Ion ImplantationIon Implantation-caused DamageBackscattering SpectrometryApplied PhysicsMass Spectrometry	2004	18
Wide angle beam ellipsometry for extremely large samples C. Major, Gergely Juhász, Zoltán Horváth, Physica status solidi. C, Conferences and critical reviews/Physica status solidi. C, Current topics in solid state physics Large SamplesEngineeringOptical TestingOptical MetrologyOptical Characterization	2008	18

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