O. Polgár

Characterization of different porous silicon structures by spectroscopic ellipsometry

M. Fried, T. Lohner, O. Polgár et al. · Thin Solid Films · 1996 · 50 citations

Materials Science, Engineering, Spectroscopy +6

High-Speed Imaging/Mapping Spectroscopic Ellipsometry for In-Line Analysis of Roll-to-Roll Thin-Film Photovoltaics

Ambalanath Shan, M. Fried, György Juhász et al. · IEEE Journal of Photovoltaics · 2013 · 38 citations

Expanded Beam Technique, Layer Thickness, Electrical Engineering +13

Comparison of algorithms used for evaluation of ellipsometric measurements random search, genetic algorithms, simulated annealing and hill climbing graph-searches

O. Polgár, M. Fried, T. Lohner et al. · Surface Science · 2000 · 35 citations

Search Optimization, Engineering, Genetic Algorithms +4

Ellipsometric characterization of damage profiles using an advanced optical model

P. Petrík, O. Polgár, M. Fried et al. · Journal of Applied Physics · 2003 · 31 citations

Optical Materials, Impact (Mechanics), Engineering +25

Expanded beam (macro-imaging) ellipsometry

M. Fried, Gergely Juhász, C. Major et al. · Thin Solid Films · 2010 · 26 citations

Beam Optic, Medical Imaging, Microscopy +5