P. Petrík

Comparative study of surface roughness measured on polysilicon using spectroscopic ellipsometry and atomic force microscopy

P. Petrík, László Péter Biró, M. Fried et al. · Thin Solid Films · 1998 · 98 citations

Materials Science, Atomic Force Microscopy, Surface Characterization +9

Porous silicon formation by stain etching

É. Vázsonyi, E. Szilágyi, P. Petrík et al. · Thin Solid Films · 2001 · 96 citations

Materials Engineering, Materials Science, Engineering +7

Reconstruction of sub-wavelength features and nano-positioning of gratings using coherent Fourier scatterometry

Nitish Kumar, P. Petrík, Gopika K. P. Ramanandan et al. · Optics Express · 2014 · 63 citations · Full text

Ellipsometric study of polycrystalline silicon films prepared by low-pressure chemical vapor deposition

P. Petrík, T. Lohner, M. Fried et al. · Journal of Applied Physics · 2000 · 57 citations

Polysilicon Layer, Optical Materials, Engineering +22

Quantitative electron microscopic autoradiography of in vivo incorporation of ³H‐choline, ³H‐leucine, ³H‐acetate and ³H‐galactose in non‐ciliated bronchiolar (Clara) cells of mice

P. Petrík, André Collet · American Journal of Anatomy · 1974 · 50 citations

Vivo Incorporation, Analytical Ultracentrifugation, Lipid Movement +18