J.L. Stehlé

Characterization of different porous silicon structures by spectroscopic ellipsometry

M. Fried, T. Lohner, O. Polgár et al. · Thin Solid Films · 1996 · 50 citations

Natural Sciences, Materials Engineering, Materials Science +14

Electron pulse shape in laser-enhanced ionization spectrometry

Thierry Berthoud, Jacek. Lipinsky, P. Camus et al. · Analytical Chemistry · 1983 · 22 citations

Natural Sciences, Chemistry, Analytical Chemistry +8

Transmission measurements in rapid growth KDP and DKDP crystals

A. Dyan, Guillaume Duchateau, Salvador Eslava et al. · Journal of Modern Optics · 2008 · 19 citations

Natural Sciences, Chemistry, Materials Science +13

Characterization of ultrathin gate dielectrics by grazing X-ray reflectance and VUV spectroscopic ellipsometry on the same instrument

Pierre Boher, Patrick Evrard, J.P. Piel et al. · Journal of Non-Crystalline Solids · 2002 · 16 citations

Natural Sciences, Materials Engineering, Materials Science +13

In situ spectroscopic ellipsometry for advanced process control in vertical furnaces

Werner Lehnert, R. Berger, Claus M. Schneider et al. · Thin Solid Films · 1998 · 16 citations

Engineering, Chemical Engineering, Chemistry +14