J.P. Piel

Second harmonic generation in alternate non-linear Langmuir-Blodgett films

Isabelle Ledoux, D. Josse, P. Fremaux et al. · Thin Solid Films · 1988 · 55 citations

Natural Sciences, Materials Science, Condensed Matter Physics +7

Characterization of different porous silicon structures by spectroscopic ellipsometry

M. Fried, T. Lohner, O. Polgár et al. · Thin Solid Films · 1996 · 50 citations

Natural Sciences, Materials Engineering, Materials Science +14

High quality transparent conductive electrodes in organic photovoltaic devices

Mahmoud Chakaroun, Bruno Lucas, Bernard Ratier et al. · Thin Solid Films · 2009 · 22 citations

Natural Sciences, Materials Engineering, Materials Science +14

Characterization of ultrathin gate dielectrics by grazing X-ray reflectance and VUV spectroscopic ellipsometry on the same instrument

Pierre Boher, Patrick Evrard, J.P. Piel et al. · Journal of Non-Crystalline Solids · 2002 · 16 citations

Natural Sciences, Materials Engineering, Materials Science +13

In situ spectroscopic ellipsometry for advanced process control in vertical furnaces

Werner Lehnert, R. Berger, Claus M. Schneider et al. · Thin Solid Films · 1998 · 16 citations

Engineering, Chemical Engineering, Chemistry +14