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Enhanced tunneling in GaN/InGaN multi-quantum-well heterojunction diodes after short-term injection annealing
44
Citations
7
References
2002
Year
SemiconductorsWide-bandgap SemiconductorElectrical EngineeringElectronic DevicesEngineeringSemiconductor TechnologyPhysicsApplied PhysicsGan/ingan SlAluminum Gallium NitrideGan Power DeviceGan/ingan SuperlatticeOptoelectronic DevicesSpace Charge RegionEnhanced TunnelingShort-term InjectionOptoelectronicsCategoryiii-v Semiconductor
Multi-quantum-well GaN/InGaN heterojunction diodes prepared by metalorganic chemical vapor deposition on sapphire showed effects of strong tunneling in their I–V characteristics. The space charge region was shown to be located in the GaN/InGaN superlattice (SL). The injection of moderately high forward currents through the structure for several hours enhanced the overall tunneling through the structure and facilitated faster tunneling between the layers in the GaN/InGaN SL. These results may have relevance to the aging characteristics of light-emitting diodes under bias.
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