Journal of Non-Crystalline Solids · 2002 · 10 citations · 16 references
Natural SciencesMaterials SciencePhysicsCondensed Matter PhysicsSemiconductor MaterialsThin FilmsAmorphous MaterialsAmorphous SemiconductorsAmorphous SolidsSemiconductor Thin FilmsThin Film AnnealingThin-film MaterialsAmorphous Semiconductor FilmsAmorphous Thin FilmsAnnealingAnnealing Temperature EffectsGallium Arsenide
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Photothermal deflection spectroscopy and detection
W. B. Jackson, Nabil M. Amer, Albert‐Claude Boccara et al. · Applied Optics · 1981 · 1.4K citations · Full text
Structural relaxation and defect annihilation in pure amorphous silicon
S. Roorda, W.C. Sinke, J. M. Poate et al. · Physical review. B, Condensed matter · 1991 · 410 citations