Polarization-Engineered Enhancement-Mode High-Electron-Mobility Transistors Using Quaternary AlInGaN Barrier Layers

B. Reuters, Ada Wille, N. Ketteniss, H. Hahn, B. Holländer, M. Heuken, H. Kalisch, Andrei Vescan

Journal of Electronic Materials · 2013 · 42 citations · 17 references

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