Performance of molecular-beam epitaxy-grown midwave infrared HgCdTe detectors on four-inch Si substrates and the impact of defects

J. B. Varesi, A. A. Buell, Jeffrey M. Peterson, R. E. Bornfreund, M. F. Vilela, W. A. Radford, S. M. Johnson

Journal of Electronic Materials · 2003 · 37 citations · 11 references

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