Journal of Electronic Materials · 1995 · 39 citations · 19 references
EngineeringMaterials EngineeringMaterials ScienceOptoelectronicsPhotonicsSemiconductor MaterialsSemiconductor Crystal GrowthSemiconductor Device MaterialsSemiconductor HeterostructuresSemiconductor NanomaterialsSemiconductor PhysicsSemiconductor SurfacesFocal Plane ArraysFocal Plane OpticsInfrared Detector ArraysSemiconductor Infrared MaterialsSubstrate Engineering
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Molecular beam epitaxial growth of CdTe and HgCdTe on Si (100)
R. Sporken, S. Sivananthan, K. K. Mahavadi et al. · Applied Physics Letters · 1989 · 107 citations
Optical techniques for composition measurement of bulk and thin-film Cd1−<i>y</i>Zn<i>y</i>Te
S. M. Johnson, S. Sen, W. H. Konkel et al. · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1991 · 74 citations
Natural Sciences, Materials Engineering, Materials Science +17