Concepedia

Temperature-ramp resistance analysis to characterize electromigration

R.W. Pasco, J.A. Schwarz

Solid-State Electronics · 1983 · 49 citations · 10 references

DOI

Concepts

References

10

Thin Films—Interdiffusion and Reactions

J. M. Poate, K. N. Tu, Jean-Claude Mayor et al. · Journal of The Electrochemical Society · 1979 · 1.7K citations

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Deviations from Matthiessen's Rule

J. Bass · Advances In Physics · 1972 · 353 citations

, , +12

RESISTANCE MONITORING AND EFFECTS OF NONADHESION DURING ELECTROMIGRATION IN ALUMINUM FILMS

R. Rosenberg, L. Berenbaum · Applied Physics Letters · 1968 · 154 citations

, , +17

The effect of copper additions on electromigration in aluminum thin films

F. M. d’Heurle · Metallurgical Transactions · 1971 · 128 citations

, , +12

Kinetics of Vacancy Motion in High-Purity Aluminum

Warren DeSorbo, David Turnbull · Physical Review · 1959 · 114 citations

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