Organic thin film transistors with HfO2 high-k gate dielectric grown by anodic oxidation or deposited by sol–gel

J. Tardy, Mohsen Erouel, Anne‐Laure Deman, A. Gagnaire, V. S. Teodorescu, M. G. Blanchin, B. Canut, A. Barău, M. Zaharescu

Microelectronics Reliability · 2006 · 73 citations · 18 references

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