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Organic thin film transistors with HfO2 high-k gate dielectric grown by anodic oxidation or deposited by sol–gel

DOI

73

Citations

18

References

2006

Year

J. Tardy, Mohsen Erouel, Anne‐Laure Deman, A. Gagnaire, V. S. Teodorescu, M. G. Blanchin, B. Canut, A. Barău, M. Zaharescu
Microelectronics Reliability

References

YearCitations

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