Concepedia

Publication | Closed Access

FeRAM technology for high density applications

DOI

165

Citations

3

References

2001

Year

Thomas Mikolajick, C. Dehm, Walter Hartner, I. Kasko, Markus Kastner, N. Nagel, Manfred Moert, C. Mazuré
Microelectronics Reliability

References

YearCitations

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