The interface screening model as origin of imprint in PbZrxTi1−xO3 thin films. I. Dopant, illumination, and bias dependence

M. Grossmann, O. Lohse, D. Bolten, +3

Journal of Applied Physics

EngineeringBias DependenceComprehensive Imprint MeasurementsFerroelectric ApplicationMolecular Beam Epitaxy +15

Relaxation mechanism of ferroelectric switching in Pb(Zr,Ti)O3 thin films

O. Lohse, M. Grossmann, Ulrich Boettger, +2

Journal of Applied Physics

Materials ScienceMagnetismSemiconductorsMultiferroicsPolarization Reversal +12

The interface screening model as origin of imprint in PbZrxTi1−xO3 thin films. II. Numerical simulation and verification

M. Grossmann, O. Lohse, D. Bolten, +2

Journal of Applied Physics

EngineeringSurface LayerThin Film Process TechnologySurface TechnologyFerroelectric Application +15

Reversible and irreversible processes in donor-doped Pb(Zr,Ti)O3

D. Bolten, U. Böttger, Theodor Schneller, +3

Applied Physics Letters

Materials EngineeringMaterials ScienceElectrical EngineeringMultiferroicsEngineering +13

Correlation between switching and fatigue in PbZr0.3Ti0.7O3 thin films

M. Grossmann, D. Bolten, O. Lohse, +3

Applied Physics Letters

Materials EngineeringSpintronicsElectrical EngineeringMaterials ScienceFatigue Behavior +10

Lifetime estimation due to imprint failure in ferroelectric SrBi2Ta2O9 thin films

M. Grossmann, O. Lohse, D. Bolten, +5

Applied Physics Letters

Non-volatile MemoryEngineeringHysteresis LoopFerroelectric Random-access MemoryLow Voltage Operation +16

Capacitance and admittance spectroscopy analysis of hydrogen-degraded Pt/(Ba, Sr)TiO3/Pt thin-film capacitors

R. Liedtke, M. Grossmann, Rainer Waser

Applied Physics Letters

Materials ScienceElectrical EngineeringEngineeringFerroelectric ApplicationOxide Electronics +13

Resistance degradation behavior of Ba_0.7Sr_0.3TiO₃ thin films compared to mechanisms found in titanate ceramics and single crystals

M. Grossmann, S. Gusowski, Rainer Waser, +5

Integrated ferroelectrics

Materials ScienceSingle CrystalsMaterial AnalysisTitanate CeramicsEngineering +9

Interface-related decrease of the permittivity in PbZrxTi1−xO3 thin films

M. Grossmann, O. Lohse, D. Bolten, +3

Applied Physics Letters

Materials ScienceElectrical EngineeringMultiferroicsDielectric ConstantEngineering +13

Reversible and Irreversible Contributions to the Polarization in SrBi₂Ta₂O₉ Ferroelectric Capacitors

O. Lohse, D. Bolten, M. Grossmann, +3

MRS Proceedings

MultiferroicsEngineeringPhysicsFerroelectric ApplicationCondensed Matter Physics +5