The interface screening model as origin of imprint in PbZrxTi1−xO3 thin films. I. Dopant, illumination, and bias dependence

M. Grossmann, O. Lohse, D. Bolten, +3

Journal of Applied Physics

EngineeringBias DependenceComprehensive Imprint MeasurementsFerroelectric ApplicationMolecular Beam Epitaxy +15

Relaxation mechanism of ferroelectric switching in Pb(Zr,Ti)O3 thin films

O. Lohse, M. Grossmann, Ulrich Boettger, +2

Journal of Applied Physics

Materials ScienceMagnetismSemiconductorsMultiferroicsPolarization Reversal +12

The interface screening model as origin of imprint in PbZrxTi1−xO3 thin films. II. Numerical simulation and verification

M. Grossmann, O. Lohse, D. Bolten, +2

Journal of Applied Physics

EngineeringSurface LayerThin Film Process TechnologySurface TechnologyFerroelectric Application +15

Reversible and irreversible processes in donor-doped Pb(Zr,Ti)O3

D. Bolten, U. Böttger, Theodor Schneller, +3

Applied Physics Letters

Materials EngineeringMaterials ScienceElectrical EngineeringMultiferroicsEngineering +13

Reversible and irreversible domain wall contributions to the polarization in ferroelectric thin films

D. Bolten, O. Lohse, Michael Grossmann, +1

Ferroelectrics

EngineeringFerroelectric Thin FilmsMagnetoresistanceMultiferroicsFerroelectric Application +15

Correlation between switching and fatigue in PbZr0.3Ti0.7O3 thin films

M. Grossmann, D. Bolten, O. Lohse, +3

Applied Physics Letters

Materials EngineeringSpintronicsElectrical EngineeringMaterials ScienceFatigue Behavior +10

Short-time piezoelectric measurements in ferroelectric thin films using a double-beam laser interferometer

Peter Arne Gerber, Andreas Roelofs, O. Lohse, +4

Review of Scientific Instruments

Optical MaterialsEngineeringFerroelectric Thin FilmsFerroelectric ApplicationOptical Properties +16

What Types of Terms Do People Use When Describing an Individual’s Personality?

Daniel Leising, Joachim Scharloth, O. Lohse, +1

Psychological Science

Cognitive SciencePersonality PsychologyInterpersonal CommunicationLinguisticsIndividual Differences +10

Lifetime estimation due to imprint failure in ferroelectric SrBi2Ta2O9 thin films

M. Grossmann, O. Lohse, D. Bolten, +5

Applied Physics Letters

Non-volatile MemoryEngineeringHysteresis LoopFerroelectric Random-access MemoryLow Voltage Operation +16

Interface-related decrease of the permittivity in PbZrxTi1−xO3 thin films

M. Grossmann, O. Lohse, D. Bolten, +3

Applied Physics Letters

Materials ScienceElectrical EngineeringMultiferroicsDielectric ConstantEngineering +13