O. Lohse

The interface screening model as origin of imprint in PbZrxTi1−xO3 thin films. I. Dopant, illumination, and bias dependence

M. Grossmann, O. Lohse, D. Bolten et al. · Journal of Applied Physics · 2002 · 228 citations

Engineering, Bias Dependence, Comprehensive Imprint Measurements +17

Relaxation mechanism of ferroelectric switching in Pb(Zr,Ti)O3 thin films

O. Lohse, M. Grossmann, Ulrich Boettger et al. · Journal of Applied Physics · 2001 · 131 citations

Materials Science, Magnetism, Semiconductors +14

The interface screening model as origin of imprint in PbZrxTi1−xO3 thin films. II. Numerical simulation and verification

M. Grossmann, O. Lohse, D. Bolten et al. · Journal of Applied Physics · 2002 · 106 citations

Engineering, Surface Layer, Thin Film Process Technology +17

Reversible and irreversible processes in donor-doped Pb(Zr,Ti)O3

D. Bolten, U. Böttger, Theodor Schneller et al. · Applied Physics Letters · 2000 · 74 citations

Materials Engineering, Materials Science, Electrical Engineering +15

Reversible and irreversible domain wall contributions to the polarization in ferroelectric thin films

D. Bolten, O. Lohse, Michael Grossmann et al. · Ferroelectrics · 1999 · 58 citations

Engineering, Ferroelectric Thin Films, Magnetoresistance +17