Modeling local electrical fluctuations in 45nm heavily pocket-implanted bulk MOSFET

Matching properties of MOS transistors

Marcel Pelgrom, Aad C.J. Duinmaijer, A.P.G. Welbers · IEEE Journal of Solid-State Circuits · 1989 · 3.3K citations

Engineering, Electrical Engineering, Materials Science +12

Characterisation and modeling of mismatch in MOS transistors for precision analog design

K.R. Lakshmikumar, R.A. Hadaway, M.A. Copeland · IEEE Journal of Solid-State Circuits · 1986 · 679 citations

Engineering, Electrical Engineering, Analog Electronics +16

Modeling statistical dopant fluctuations in MOS transistors

P.A. Stolk, F. Widdershoven, D.B.M. Klaassen · IEEE Transactions on Electron Devices · 1998 · 411 citations

Engineering, Computer Engineering, Electrical Engineering +17

Transistor matching in analog CMOS applications

Marcel Pelgrom, Hans Tuinhout, M. Vertregt · 2002 · 306 citations

Engineering, Electrical Engineering, Analog Electronics +16

Suppression of random dopant-induced threshold voltage fluctuations in sub-0.1-μm MOSFET's with epitaxial and δ-doped channels

Asen Asenov, S. Saini · IEEE Transactions on Electron Devices · 1999 · 161 citations

Engineering, Computer Engineering, Electrical Engineering +17