Interface chemistry and surface morphology in the initial stages of growth of GaN and AlN on α-SiC and sapphire

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Fundamentals of surface and thin film analysis

L. C. Feldman, James W. Mayer, F. Adams · Analytica Chimica Acta · 1989 · 911 citations

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Effects of ain buffer layer on crystallographic structure and on electrical and optical properties of GaN and Ga1−AlN (0 < x ≦ 0.4) films grown on sapphire substrate by MOVPE

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Engineering, Materials Engineering, Materials Science +13