F. Adams

Fundamentals of surface and thin film analysis

L. C. Feldman, James W. Mayer, F. Adams · Analytica Chimica Acta · 1989 · 911 citations

Materials Science, Surface Characterization, Engineering +5

Automated segmentation of μ-XRF image sets

Bart Vekemans, Koen Janssens, László Vincze et al. · X-Ray Spectrometry · 1997 · 73 citations

Image Analysis, Machine Vision, Engineering +14

Monte Carlo simulation of X-ray fluorescence spectra: Part 4. Photon scattering at high X-ray energies

László Vincze, Koen Janssens, Bart Vekemans et al. · Spectrochimica Acta Part B Atomic Spectroscopy · 1999 · 67 citations

X-ray Spectroscopy, Engineering, Physics +11

A micro-XRF spectrometer based on a rotating anode generator and capillary optics

Koen Janssens, B. Vekemans, László Vincze et al. · Spectrochimica Acta Part B Atomic Spectroscopy · 1996 · 50 citations

Capillary Optics, Electrical Engineering, Engineering +12

Laser microprobe mass analysis of asbestos fiber surfaces for organic compounds

J. K. De Waele, Etienne F. Vansant, P. Van Espen et al. · Analytical Chemistry · 1983 · 31 citations

Materials Science, Asbestos Fiber Surfaces, Advanced Laser Processing +15