Assessment of wheat grain texture by near infrared reflectance measurements on bühler‐milled flour

Abstract

Abstract A calibration is presented between near infrared (n.i.r.) reflectance data at 1720 and 1288 nm and wheat grain kernel texture as determined by air‐jet sieving on flour Bühler‐milled from home‐grown wheat. A multiple correlation of 0.996 and a residual standard deviation of 0.140 was achieved with a calibration set of 40 samples and the result was verified by prediction of values of further samples. The calibration was valid over two successive harvests (1978 and 1979) A separate calibration was obtained using a Neotec 101 instrument using data around 2230 nm when a multiple correlation of 0.974 and residual standard deviation of 0.32 was obtained. A calibration equation and pulse point are presented.