Reflectance Spectroscopy
Reflectance Spectroscopy is a non-invasive optical diagnostic technique that, as a distinct method within the broader category of spectroscopic analysis, measures the intensity of light reflected from a material as a function of wavelength to characterize its optical properties, particularly in semiconductors, by distinguishing surface and bulk contributions to reflectance.
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2017–2026
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Reflection Spectroscopy
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Centre National de la Recherche Scientifique
Paris, France
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410 publications
21.2K citations

Agricultural Research Service
Washington, United States
32 h-index
143 publications
8.9K citations

Chinese Academy of Sciences
Beijing, China
31 h-index
257 publications
12.3K citations
Politecnico di Milano
Milan, Italy
26 h-index
118 publications
9.4K citations

Pennsylvania State University
State College, United States
25 h-index
77 publications
4.3K citations
Universidade de São Paulo
São Paulo, Brazil
24 h-index
93 publications
3.8K citations
University of Wisconsin–Madison
Madison, United States
23 h-index
93 publications
7.9K citations

University of Alberta
Edmonton, Canada
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60 publications
3.4K citations
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JNIRS · 83 publications · 3.9K citations
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