Reflectance Spectroscopy

Reflectance Spectroscopy is a non-invasive optical diagnostic technique that, as a distinct method within the broader category of spectroscopic analysis, measures the intensity of light reflected from a material as a function of wavelength to characterize its optical properties, particularly in semiconductors, by distinguishing surface and bulk contributions to reflectance.

4.2K

Publications

216.1K

Citations

13.9K

Authors

3.1K

Institutions

Publications per year

2017–2026

873

Authors

13.9K

  1. AT
    Alessandro Torricelli

    Politecnico di Milano, Italy

    37 publications · 2.1K citations

    25

    h-index

  2. HJ
    Henricus J. C. M. Sterenborg

    Erasmus MC, Netherlands

    31 publications · 1.6K citations

    22

    h-index

  3. WR
    W. Richter

    Technische Universität Berlin, Germany

    41 publications · 1K citations

    20

    h-index

  4. BH
    Benno H. W. Hendriks

    Philips (Netherlands), Netherlands

    27 publications · 944 citations

    20

    h-index

  5. DC
    Daniel Cozzolino

    Australian Wine Research Institute, Australia

    23 publications · 870 citations

    19

    h-index

1–5 of 13.9K

Venues

  1. Applied Spectroscopy

    110 publications · 9.1K citations

    39

    h-index

  2. Journal of Biomedical Optics

    84 publications · 3.7K citations

    37

    h-index

  3. Journal of Near Infrared Spectroscopy

    JNIRS · 83 publications · 3.9K citations

    34

    h-index

  4. Applied Optics

    57 publications · 3.6K citations

    32

    h-index

  5. International Journal of Remote Sensing

    49 publications · 4K citations

    30

    h-index

1–5