Small-angle cleavage of semiconductors for transmission electron microscopy

The preparation of cross‐section specimens for transmission electron microscopy

J. C. Bravman, Robert Sinclair · Journal of Electron Microscopy Technique · 1984 · 524 citations

Natural Sciences, Materials Science, Physics +11

Cross-sectional specimens for transmission electron microscopy

M. S. Abrahams, C. J. Buiocchi · Journal of Applied Physics · 1974 · 119 citations

Engineering, Materials Engineering, Materials Science +17

Epitaxial Y1Ba2Cu3O7 thin films on CeO2 buffer layers on sapphire substrates

M. W. Denhoff, J. P. McCaffrey · Journal of Applied Physics · 1991 · 74 citations · Full text

Natural Sciences, Materials Science, Physics +12

A Grinding/Polishing Tool for TEM Sample Preparation

Stanley J. Klepeis, J. Benedict, Ron Anderson · MRS Proceedings · 1987 · 72 citations

Natural Sciences, Materials Engineering, Materials Science +7

Transmission Electron Microscopy of Silicon VLSI Circuits and Structures

D. J. Barber · Electronics and Power · 1984 · 58 citations

Engineering, Computer Engineering, Electrical Engineering +14