Publication | Closed Access
Reliability screening of high-k dielectrics based on voltage ramp stress
88
Citations
4
References
2007
Year
ReliabilityElectrical EngineeringReliability EngineeringDielectricsEngineeringTime-dependent Dielectric BreakdownCircuit ReliabilityElectronic PackagingDevice ReliabilityMicroelectronicsReliability ScreeningPhysic Of FailureElectrical InsulationElectromagnetic Compatibility
| Year | Citations | |
|---|---|---|
Page 1
Page 1