ESD failure analysis methodology

ESD on CHMOS Devices - Equivalent Circuits, Physical Models and Failure Mechanisms

Neeraj Khurana, Timothy J. Maloney, Wen‐Hao Yeh · Reliability physics · 1985 · 85 citations

Engineering, Electrical Engineering, Circuit Theory +15

Non-uniform triggering of gg-nMOSt investigated by combined emission microscopy and transmission line pulsing

C. Russ, Karlheinz Bock, Mahmoud Rasras et al. · 2002 · 55 citations

Natural Sciences, Cell Biology, Biophotonics +4

A Method of Detecting Hot Spots on Semiconductors using Liquid Crystals

John Hiatt · Reliability physics · 1981 · 52 citations

Engineering, Computer Engineering, Electrical Engineering +17

A Model for the Failure of Bipolar Silicon Integrated Circuits Subjected to Electrostatic Discharge

Thomas S. Speakman · Reliability physics · 1974 · 47 citations

Engineering, Electrical Engineering, Materials Science +17

Infrared Light Emission From Semiconductor Devices

Daniel L. Barton, Paiboon Tangyunyong, J.M. Soden et al. · Proceedings - International Symposium for Testing and Failure Analysis · 1996 · 45 citations · Full text

Engineering, Electrical Engineering, Materials Science +17