Synchrotron topography and X-ray diffraction study of GaInP layers grown on GaAs/Ge

A. Lankinen, L. Knuuttila, Pasi Kostamo, T. Tuomi, Harri Lipsanen, P.J. McNally, L. O’Reilly

Journal of Crystal Growth · 2009 · 12 citations · 24 references

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