Synchrotron X-ray Diffraction

Synchrotron X-Ray Diffraction is a specialized form of X-ray diffraction that utilizes high-intensity, tunable X-ray beams generated by synchrotron radiation to achieve enhanced resolution and sensitivity in the structural analysis of crystalline materials.

4.8K

Publications

246.4K

Citations

17.9K

Authors

2.7K

Institutions

Publications per year

2017–2026

1.3K

Authors

17.9K

  1. VB
    Vitali B. Prakapenka

    University of Chicago, United States

    57 publications · 5K citations

    33

    h-index

  2. JC
    Jonathan C. Hanson

    Brookhaven National Laboratory, United States

    43 publications · 4.2K citations

    32

    h-index

  3. YR
    Yang Ren

    Argonne National Laboratory, United States

    59 publications · 3.6K citations

    31

    h-index

  4. TR
    Torben R. Jensen

    Aarhus University, Denmark

    37 publications · 2.1K citations

    27

    h-index

  5. RJ
    Russell J. Hemley

    Carnegie Institution for Science, United States

    31 publications · 3.8K citations

    27

    h-index

1–5 of 17.9K

Venues

  1. Journal of the American Chemical Society

    JACS · 130 publications · 18.5K citations

    73

    h-index

  2. Chemistry of Materials

    162 publications · 10.9K citations

    58

    h-index

  3. Physical Review Letters

    PRL · 77 publications · 7.6K citations

    51

    h-index

  4. Acta Materialia

    80 publications · 5.4K citations

    46

    h-index

  5. The Journal of Physical Chemistry C

    156 publications · 6.3K citations

    46

    h-index

1–5