A. Lankinen

Following the Kinetics of a Chemical Reaction in Ultrathin Supported Polymer Films by Reliable Mass Density Determination with X-ray Reflectivity

Eero Kontturi, A. Lankinen · Journal of the American Chemical Society · 2010 · 34 citations

Natural Sciences, Chemistry, Materials Science +13

Low Temperature Growth GaAs on Ge

L. Knuuttila, A. Lankinen, J. Likonen et al. · Japanese Journal of Applied Physics · 2005 · 32 citations

Engineering, Materials Engineering, Materials Science +17

Synchrotron X-ray topography study of defects in indium antimonide P-I-N structures grown by metal organic vapour phase epitaxy

Juha Riikonen, T. Tuomi, A. Lankinen et al. · Journal of Materials Science Materials in Electronics · 2005 · 17 citations

Natural Sciences, Materials Science, Physics +16

Constraints on micro-Raman strain metrology for highly doped strained Si materials

L. O’Reilly, Ken Horan, P.J. McNally et al. · Applied Physics Letters · 2008 · 17 citations · Full text

Engineering, Materials Engineering, Materials Science +17

Synchrotron topography and X-ray diffraction study of GaInP layers grown on GaAs/Ge

A. Lankinen, L. Knuuttila, Pasi Kostamo et al. · Journal of Crystal Growth · 2009 · 12 citations · Full text

Natural Sciences, Materials Engineering, Materials Science +14