Concepedia

Publication | Closed Access

Life expectancy and characterization of capacitive RF MEMS switches

DOI

22

Citations

8

References

2010

Year

M. Matmat, Konstantinos Koukos, Fabio Coccetti, Tonio Idda, A. Marty, Christophe Escriba, J-Y. Fourniols, D. Estève
Microelectronics Reliability

References

YearCitations

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