R.W. Herfst - Concepedia

Author

R.W. Herfst

Also Known As

Herfst, Rodolf, Herfst, Rodolf W., Kramer, G. F. IJ., R. Herfst, R. W. Herfst, R.W. Herfst, Rodolf Herfst, Rodolf W. Herfst

Publications

559

Citations

H-Index

Concepts

All Affiliations

University of Twente NXP (Netherlands)Netherlands Organisation for Applied Scientific Research Delft University of Technology Philips (Netherlands)

About

R.W. Herfst is an author at University of Twente specializing in engineering, applied physics, and microelectronics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	11	12	448
2	Applied Physics	9	9	327
3	Education	1	1	14
4	Medicine	1	1	38
5	Natural Sciences	1	1	64

R.W. Herfst

Publications

462

Citations

H-Index

Page 1

	Year	Citations
Characterization of dielectric charging in RF MEMS capacitive switches R.W. Herfst, H.G.A. Huizing, Peter G. Steeneken, Electrical EngineeringDielectricsEngineeringMeasurement MethodCharge Injection	2006	72
Metropolitan-scale heralded entanglement of solid-state qubits Arian Stolk, Kian L. van der Enden, Marie-Christine Slater, Science Advances EngineeringQuantum ComputingQuantum ProtocolsQuantum InternetQuantum Network	2024	64
Kelvin probe study of laterally inhomogeneous dielectric charging and charge diffusion in RF MEMS capacitive switches R.W. Herfst, Peter G. Steeneken, Jurriaan Schmitz, EngineeringMicroscopyCharge TransportInhomogeneous Dielectric ChargingTrapped Charges	2008	56
Time and voltage dependence of dielectric charging in RF MEMS capacitive switches R.W. Herfst, Peter G. Steeneken, Jurriaan Schmitz Electrical EngineeringDielectricsEngineeringVoltage DependenceNanoelectronics	2007	54
Atom lithography of Fe E. te Sligte, Bart Smeets, K. Stam, Applied Physics Letters EngineeringElectron-beam LithographyMagnetic ResonanceAtom LithographyAtom Beam	2004	49
Center-Shift Method for the Characterization of Dielectric Charging in RF MEMS Capacitive Switches R.W. Herfst, Peter G. Steeneken, H.G.A. Huizing, IEEE Transactions on Semiconductor Manufacturing Electrical EngineeringEngineeringRadio FrequencyDielectric ChargingWireless Implantable Device	2008	38
High-throughput atomic force microscopes operating in parallel Hamed Sadeghian, R.W. Herfst, Bert Dekker, Review of Scientific Instruments Atomic Force MicroscopyEngineeringAfm InstrumentMicroscopyMicrofabrication	2017	38
Systematic characterization of optical beam deflection measurement system for micro and nanomechanical systems R.W. Herfst, Wimar Klop, Martin Eschen, Measurement Systematic CharacterizationPhotonicsOptical MaterialsEngineeringMicrofabrication	2014	20
Identifying degradation mechanisms in RF MEMS capacitive switches R.W. Herfst, Peter G. Steeneken, Jurriaan Schmitz Proceedings, IEEE micro electro mechanical systems Electrical EngineeringEngineeringC-v Curve NarrowingC-v CurvesApplied Physics	2008	20
Parallel, miniaturized scanning probe microscope for defect inspection and review Hamed Sadeghian, T.C. van den Dool, Will Crowcombe, Proceedings of SPIE, the International Society for Optical Engineering/Proceedings of SPIE EngineeringMicroscopyMeasurementDefect InspectionEducation	2014	14

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