H.G.A. Huizing

Energetics of Self-Interstitial Clusters in Si

N. E. B. Cowern, Giovanni Mannino, P.A. Stolk et al. · Physical Review Letters · 1999 · 313 citations

Natural Sciences, Materials Science, Physics +13

Characterization of dielectric charging in RF MEMS capacitive switches

R.W. Herfst, H.G.A. Huizing, Peter G. Steeneken et al. · 2006 · 72 citations · Full text

Engineering, Electrical Engineering, Physics +17

A-BCD: An economic 100 V RESURF silicon-on-insulator BCD technology for consumer and automotive applications

J.A. van der Pol, A.W. Ludikhuize, H.G.A. Huizing et al. · 2002 · 62 citations

Engineering, Electrical Engineering, Electronic Materials +16

Ultrafast interstitial injection during transient enhanced diffusion of boron in silicon

H.G.A. Huizing, C.C.G. Visser, N. E. B. Cowern et al. · Applied Physics Letters · 1996 · 43 citations

Engineering, Materials Engineering, Materials Science +17

Center-Shift Method for the Characterization of Dielectric Charging in RF MEMS Capacitive Switches

R.W. Herfst, Peter G. Steeneken, H.G.A. Huizing et al. · IEEE Transactions on Semiconductor Manufacturing · 2008 · 39 citations · Full text

Engineering, Electrical Engineering, Materials Science +17