Concepedia

Publication | Closed Access

In situ crystallisation in ZrO2 thin films during high temperature X-ray diffraction

DOI

29

Citations

5

References

2001

Year

Chao Zhao, Gert Roebben, H. Bender, Edward Young, Suvi Haukka, Michel Houssa, M. Naili, Stefan De Gendt, Marc Heyns, Omer Van der Biest
Microelectronics Reliability

References

YearCitations

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