Electronics Letters · 1996 · 32 citations · 5 references
EngineeringElectrical EngineeringMaterials ScienceMicroelectronicsSemiconductor DevicesSemiconductor MaterialsIntegrated Circuit DesignSemiconductor Device MaterialsSemiconductor HeterostructuresWide Band Gap SemiconductorsWide-bandgap Semiconductor DevicesWide-bandgap SemiconductorsBarrier MaterialsCapacitanceDouble Heterostructure DevicesDouble HeterostructuresElectrical PropertiesHeterostructure DevicesHeterostructuresLeakage
Single (SHBV) and dual (DHBV) heterostructure barrier varactors with AlAs/In0.52Al0.48As blocking conduction layers have been fabricated and characterised. The devices, whose electrical properties scale with layer complexity, exhibit, for a DHBV scheme, leakage currents as low as 10 A/cm2 at 12 V, a zero bias capacitance of 1 fF/µm2, and a capacitance ratio of 5:1.
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Planar multi-stack quantum barrier varactortripler evaluation at W-band
A. Rahal, E. Boch, Chris Rogers et al. · Electronics Letters · 1995 · 14 citations