Solid-State Electronics · 2010 · 16 citations · 8 references
EngineeringElectrical EngineeringElectronic MaterialsMicroelectronicsSemiconductor DevicesHigh-frequency Semiconductor DevicesIii-v SemiconductorsSemiconductor ReliabilityWide Band Gap SemiconductorsWide-bandgap Semiconductor DevicesWide-bandgap SemiconductorsBreakdown VoltageBreakdown Voltage OptimizationGallium NitrideGallium Nitride (Gan) MaterialsGallium Nitride Power DevicesWide Bandgap Semiconductor Applications
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GaN: Processing, defects, and devices
S. J. Pearton, J.C. Zolper, R. J. Shul et al. · Journal of Applied Physics · 1999 · 1.8K citations
Design of edge termination for GaN power Schottky diodes
J. R. LaRoche, F. Ren, K. W. Baik et al. · Journal of Electronic Materials · 2005 · 42 citations