Applied Physics Letters · 1982 · 35 citations · 9 references
Multilayer TheoryOptical MaterialsX-ray SpectroscopyEngineeringPhysicsOptical PropertiesX-ray DiffractionApplied PhysicsReflectionBragg ConditionMaximum ReflectivityOptoelectronicsX-ray OpticReflectanceDepth-graded Multilayer CoatingMultilayer SystemsX-ray Imaging
The angle of maximum reflectivity from a multilayer x-ray reflector is influenced by absorption in the medium. Using multilayer theory we show how the full refractive correction compares to the usual correction that includes only the effect of dispersion. The physical significance of the two corrections is discussed. The absorption correction is computed for some multilayer systems of current interest.
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X-Rays in Theory and Experiment
Arthur Holly Compton, S Allison · Students Quarterly Journal · 1935 · 912 citations · Full text
Zdeněk Knittl, Peter H. Berning · Physics Today · 1977 · 481 citations
Controlled fabrication of multilayer soft-x-ray mirrors
Eberhard Spiller, Armin Segmüller, J. C. Rife et al. · Applied Physics Letters · 1980 · 111 citations