Armin Segmüller - Concepedia

Author

Armin Segmüller

IBM Research - Thomas J. Watson Research Center

Also Known As

ARMIN SEGMÜLLER, Armin P. Segmüller, Armin Segmuller, Armin Segmüller, Armin Segmüller

Publications

Citations

H-Index

Concepts

All Affiliations

IBM Research - Thomas J. Watson Research Center IBM (United States)Universität Hamburg Deutsches Elektronen-Synchrotron DESY

About

Armin Segmüller is an author at IBM Research - Thomas J. Watson Research Center specializing in applied physics, engineering, and materials science.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	24	33	2.7K
2	Applied Physics	24	34	2.7K
3	Natural Sciences	9	9	1.4K
4	Chemistry	2	2	131
5	Health Sciences	1	1	17

Armin Segmüller

Publications

2.7K

Citations

H-Index

Page 1

	Year	Citations
Diluted magnetic III-V semiconductors H. Munekata, Hideo Ohno, S. von Molnár, Physical Review Letters Wide-bandgap SemiconductorMagnetic PropertiesEngineeringMagnetoresistanceSemiconductors	1989	1.1K
Propagation of x rays in waveguides Eberhard Spiller, Armin Segmüller Applied Physics Letters PhotonicsWaveguidesX-ray SpectroscopyEngineeringPhysics	1974	151
High resolution X-ray diffraction from small numbers of Langmuir-Blodgett layers of manganese stearate M. Pomerantz, Armin Segmüller Thin Solid Films Materials ScienceX-ray CrystallographyManganese StearateEngineeringInorganic Material	1980	147
Controlled fabrication of multilayer soft-x-ray mirrors Eberhard Spiller, Armin Segmüller, J. C. Rife, Applied Physics Letters Optical MaterialsEngineeringOptical CoatingsThin Film Process TechnologyOptical Properties	1980	111
Preparation of Literally Two-Dimensional Magnets M. Pomerantz, F. H. Dacol, Armin Segmüller Physical Review Letters EngineeringLow-dimensional MagnetismMagnetic ResonanceOne-dimensional MagnetismChemistry	1978	99
X-ray diffraction studies of thin films and multilayer structures Armin Segmüller, I. C. Noyan, V. S. Speriosu Progress in Crystal Growth and Characterization Materials ScienceEngineeringX-ray DiffractionApplied PhysicsThin Films	1989	93
Smooth multilayer films suitable for x-ray mirrors R.‐P. Haelbich, Armin Segmüller, Eberhard Spiller Applied Physics Letters Short Wavelength OpticOptical MaterialsEngineeringUseful Normal-incidence MirrorsOptical Coatings	1979	91
Automatic x-ray diffraction measurement of the lattice curvature of substrate wafers for the determination of linear strain patterns Armin Segmüller, J. Angilelo, S. J. La Placa Journal of Applied Physics EngineeringMechanical EngineeringLocalized BendingSubstrate WafersX-ray Imaging	1980	88
Observation of X-ray interferences on thin films of amorphous silicon Armin Segmüller Thin Solid Films Materials ScienceEngineeringSilicon On InsulatorX-ray DiffractionApplied Physics	1973	82
The Microstructure of High—Critical Current Superconducting Films P. Chaudhari, F. K. LeGoues, Armin Segmüller Science Superconducting MaterialEngineeringCritical CurrentsGrain BoundariesSuperconductivity	1987	65

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