Publication | Closed Access
Interconnect reliability – A study of the effect of dimensional and porosity scaling
22
Citations
34
References
2010
Year
ReliabilityElectrical EngineeringReliability EngineeringEngineeringAdvanced Packaging (Semiconductors)Applied PhysicsPorosity ScalingInterconnect ReliabilityDevice ReliabilityInterconnect (Integrated Circuits)
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|---|---|---|
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