Journal of Applied Physics · 1977 · 36 citations · 4 references
EngineeringElectrical EngineeringMaterials ScienceMicroelectronicsMicrowave EngineeringSemiconductor DevicesCarrier TransportEpitaxial GrowthHigh-frequency Semiconductor DevicesMicrowave Semiconductor DevicesSemiconductor PhysicsSemiconductor Thin FilmsHall EffectLow-noise Microwave TransistorsMicrowave TransistorsNoise FigureNoise In Field-effect TransistorsNoise In High-frequency Semiconductor DevicesPower Added EfficiencySemiconductor Noise
The low-noise FET’s prepared on molecular-beam-epitaxial (MBE) layers have a noise figure of 1.9 dB with a corresponding gain of 11 dB at 6 GHz. The power FET’s can produce 1.3 W at 4.4 GHz (1-dB compression) with a gain of 10 dB and a power-added efficiency of 35%. The influence of substrate preparation on Hall mobility for very thin layers was also studied and there is no evidence of Cr diffusion from the substrate at the MBE growth temperature.
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Growth of Periodic Structures by the Molecular-Beam Method
A. Y. Cho · Applied Physics Letters · 1971 · 146 citations