Microelectronics Journal · 2005 · 15 citations · 17 references
EngineeringElectrical EngineeringElectronic MaterialsMicroelectronicsSemiconductor DevicesCurrent-voltage CharacteristicsDevice CharacterizationDevice ModelingDevice ScalingMetal-oxide-semiconductor Field-effect TransistorsShort-channel EffectsCurrent-voltage CharacterizationCurrent-voltage RelationsCurrent-voltage RelationshipMetal-oxide-semiconductor Field-effect Transistor ModelingMosfet ModelingSaturation CurrentSaturation RegionShort-circuit Current
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