Concepedia

Reflection and transmission X-ray topographic study of a SiC crystal and epitaxial wafer

Hiroshi Yamaguchi, Shin–ichi Nishizawa, Wook Bahng, Katsuyoshi Fukuda, S. Yoshida, Kenta Arai, Yukio Takano

Materials Science and Engineering B · 1999 · 10 citations · 3 references

DOI

Concepts

References

3

White-beam synchrotron topographic studies of defects in 6H-SiC single crystals

Michael Dudley, Shaoping Wang, Wei Huang et al. · Journal of Physics D Applied Physics · 1995 · 111 citations

, , +17

An optical and X-ray topographic study of giant screw dislocations in silicon carbide

P. Krishna, S. S. Jiang, A. R. Lang · Journal of Crystal Growth · 1985 · 44 citations

, , +15

A New Method of X-Ray Diffraction Topography Using Monochromatic Divergent Beams Made by a Curved Crystal

Kazutake Köhra, Yukio Takáno · Japanese Journal of Applied Physics · 1968 · 42 citations

, , +17