Wook Bahng

Current conduction mechanisms in atomic-layer-deposited HfO2/nitrided SiO2 stacked gate on 4H silicon carbide

Kuan Yew Cheong, Jeong Hyun Moon, Hyeong Joon Kim et al. · Journal of Applied Physics · 2008 · 137 citations

Engineering, Silicon Carbide, Silicon On Insulator +16

Improved Electronic Performance of $\hbox{HfO}_{2}/ \hbox{SiO}_{2}$ Stacking Gate Dielectric on 4H SiC

Kuan Yew Cheong, Jeong Hyun Moon, Tae Joo Park et al. · IEEE Transactions on Electron Devices · 2007 · 43 citations

Engineering, Electronic Performance, Silicon On Insulator +17

Electronic Properties of Atomic-Layer-Deposited Al[sub 2]O[sub 3]/Thermal-Nitrided SiO[sub 2] Stacking Dielectric on 4H SiC

Kuan Yew Cheong, Jeong Hyun Moon, Dail Eom et al. · Electrochemical and Solid-State Letters · 2006 · 42 citations

Materials Science, Materials Engineering, Electrical Engineering +12

Analysis of current conduction mechanisms in atomic-layer-deposited Al2O3 gate on 4H silicon carbide

Kuan Yew Cheong, Jeong Hyun Moon, Hyeong Joon Kim et al. · Applied Physics Letters · 2007 · 40 citations

Materials Engineering, Wide-bandgap Semiconductor, Electrical Engineering +14

Effects of post-oxidation annealing temperature on ZrO2 thin film deposited on 4H-SiC substrate

Tedi Kurniawan, Yew Hoong Wong, Kuan Yew Cheong et al. · Materials Science in Semiconductor Processing · 2011 · 34 citations

Materials Engineering, Materials Science, Engineering +8