Electromigration testing of Ti: W/Al and Ti: W/Al-Cu film conductors

Thin Films—Interdiffusion and Reactions

J. M. Poate, K. N. Tu, Jean-Claude Mayor et al. · Journal of The Electrochemical Society · 1979 · 1.7K citations

Natural Sciences, Materials Engineering, Materials Science +12

Electromigration—A brief survey and some recent results

J. R. Black · IEEE Transactions on Electron Devices · 1969 · 1.5K citations

Engineering, Electrical Engineering, Materials Science +17

Current-induced marker motion in gold wires

H. B. Huntington, A. Gröne · Journal of Physics and Chemistry of Solids · 1961 · 836 citations

Engineering, Electrical Engineering, Physics +13

Reduction of Electromigration in Aluminum Films by Copper Doping

I. Ames, F. M. d’Heurle, R. E. Horstmann · IBM Journal of Research and Development · 1970 · 301 citations

Natural Sciences, Materials Engineering, Materials Science +17

Electromigration Damage in Aluminum Film Conductors

M. J. Attardo, R. Rosenberg · Journal of Applied Physics · 1970 · 264 citations

Natural Sciences, Materials Engineering, Materials Science +16