P. B. Ghate - Concepedia

Author

P. B. Ghate

Texas Instruments (United States)

Also Known As

P. B. GHATE, P. B. Ghate, P. Ghate, P.B. Ghate, Pundlik Ghate

Publications

1.5K

Citations

H-Index

Concepts

All Affiliations

Texas Instruments (United States)Cornell University Rensselaer Polytechnic Institute

About

P. B. Ghate is an author at Texas Instruments (United States) specializing in engineering, materials science, and applied physics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	21	26	1.4K
2	Applied Physics	16	20	1.1K
3	Natural Sciences	2	2	49
4	Chemistry	2	2	49
5	Computer Engineering	1	1	10

P. B. Ghate

Publications

1.4K

Citations

H-Index

Page 1

	Year	Citations
Third-Order Elastic Constants of Alkali Halide Crystals P. B. Ghate Physical Review Materials ScienceCrystal StructureSolid-state IonicThird-order Elastic ConstantsEngineering	1965	246
Morse-Potential Evaluation of Second- and Third-Order Elastic Constants of Some Cubic Metals R. C. Lincoln, K. M. Koliwad, P. B. Ghate Physical Review EngineeringMechanical EngineeringElasticity (Physics)MechanicsMicrostructure-strength Relationship	1967	204
Application of Ti: W barrier metallization for integrated circuits P. B. Ghate, J.C. Blair, C.R. Fuller, Thin Solid Films Materials EngineeringMaterials ScienceEngineeringMetallurgical InteractionW Barrier Metallization	1978	112
Improved metallization for surface acoustic wave devices J.I. Latham, W.R. Shreve, N.J. Tolar, Thin Solid Films Materials ScienceEngineeringMicrofabricationPhysical AcousticAcoustic Metamaterial	1979	77
Screened Interaction Model for Impurity Diffusion in Zinc P. B. Ghate Physical Review Materials ScienceMaterials EngineeringEngineeringDiffusion ResistancePhysics	1964	75
Electromigration-Induced Failures in VLSI Interconnects P. B. Ghate EngineeringChip TemperatureElectromigration-induced FailuresInterconnect (Integrated Circuits)Corrosion	1982	72
Metallization in microelectronics P. B. Ghate, J.C. Blair, C.R. Fuller Thin Solid Films Materials ScienceEngineeringMetallurgical SystemMetallurgical InteractionMetallurgical Process	1977	68
Metallization for very-large-scale integrated circuits P. B. Ghate Thin Solid Films Materials ScienceWafer Scale ProcessingEngineeringMicrofabricationMetallurgical Interaction	1982	57
ELECTROMIGRATION-INDUCED FAILURES IN ALUMINUM FILM CONDUCTORS J.C. Blair, P. B. Ghate, C. T. Haywood Applied Physics Letters EngineeringElectromigration-induced FailuresChemical DepositionCorrosionElectronic Packaging	1970	56
SOME OBSERVATIONS ON THE ELECTROMIGRATION IN ALUMINUM FILMS P. B. Ghate Applied Physics Letters Materials ScienceElectrical EngineeringElectromigration TechniqueEngineeringSpecific Resistance	1967	54

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