Concepedia

Investigation of Kelvin probe force microscopy efficiency for the detection of hydrogen ingress by cathodic charging in an aluminium alloy

Céline Larignon, Joël Alexis, Éric Andrieu, Loïc Lacroix, Grégory Odemer, Christine Blanc

Scripta Materialia · 2012 · 55 citations · 18 references

DOI

Concepts

References

18

Kelvin probe force microscopy

M. Nonnenmacher, M. O’Boyle, H. K. Wickramasinghe · Applied Physics Letters · 1991 · 2.3K citations

, , +16

High-resolution capacitance measurement and potentiometry by force microscopy

Yves Martin, David W. Abraham, H. K. Wickramasinghe · Applied Physics Letters · 1988 · 690 citations

, , +12

V. <i>Contact electricity of metals</i>

Lord Kelvin · The London Edinburgh and Dublin Philosophical Magazine and Journal of Science · 1898 · 435 citations · Full text

High resolution atomic force microscopy potentiometry

Jonathan Weaver, David W. Abraham · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1991 · 404 citations

, , +10

Corrosion Study of AA2024‐T3 by Scanning Kelvin Probe Force Microscopy and In Situ Atomic Force Microscopy Scratching

Patrik Schmutz, G. S. Frankel · Journal of The Electrochemical Society · 1998 · 317 citations · Full text