Specimen Charging is an artifact in electron microscopy arising when a non-conductive specimen accumulates incident electrons, leading to localized electrostatic charge buildup that distorts imaging and analytical measurements.
180
Publications
9K
Citations
508
Authors
209
Institutions
Publications per year
2017–2026
13
Parents
Publications
180
Low voltage scanning electron microscopy
David C. Joy, Carolyn S. Joy · Micron · 1996 · 322 citations
D. M. Pai, B. E. Springett · Reviews of Modern Physics · 1993 · 304 citations
Motomichi Koyama, Eiji Akiyama, Kaneaki Tsuzaki et al. · Acta Materialia · 2013 · 277 citations
Natural Sciences, Materials Engineering, Materials Science +17
1–5 of 180
Authors
508
- DC
5
h-index
- HG
4
h-index
- BL
4
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- CK
4
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- MT
4
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1–5 of 508
Institutions
209
University of Cambridge
Cambridge, United Kingdom
8 h-index
19 publications
674 citations
National University of Singapore
Singapore, Singapore
6 h-index
20 publications
650 citations
Oak Ridge National Laboratory
Oak Ridge, United States
6 h-index
7 publications
811 citations
University of California, Berkeley
Berkeley, United States
5 h-index
9 publications
326 citations
University of Tennessee at Knoxville
Knoxville, United States
5 h-index
7 publications
511 citations
Xi'an Jiaotong University
Xi'an, China
4 h-index
8 publications
172 citations
Lawrence Berkeley National Laboratory
Berkeley, United States
4 h-index
10 publications
392 citations
Technical University of Denmark
Kongens Lyngby, Denmark
4 h-index
6 publications
128 citations
1–8 of 209
Venues
- Journal of Applied Physics
20 publications · 962 citations
18
h-index
- Journal of Microscopy
14 publications · 631 citations
14
h-index
- Scanning
15 publications · 403 citations
12
h-index
- Microscopy and Microanalysis
10 publications · 327 citations
10
h-index
- Ultramicroscopy
7 publications · 457 citations
7
h-index
1–5