2012 · 18 citations · 1 references
EngineeringComputer EngineeringElectrical EngineeringMicroelectronicsBuilt-in Self-testComplementary Metal-oxide-semiconductor TechnologyDevice CharacterizationDevice ReliabilityMemory Subsystem DesignSignal IntegrityRadiation-hardened MemoryRadiation-hardened Memory DevicesRadiation-hardened MicroprocessorsSram Physical Unclonable Functions
The SEU, SET, and SEFI heavy ion test results are presented for a 16Mbit MRAM device. The device has been hardened for SEL immunity (≤ 100 MeV·cm2/mg) and TID immunity (≤ 1 Mrad(Si)).
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D.N. Nguyen, Farokh Irom · 2007 · 26 citations