Concepedia

Publication | Closed Access

Reliability data’s of 0.5μm AlGaN/GaN on SiC technology qualification

DOI

18

Citations

3

References

2012

Year

Benoît Lambert, J. Thorpe, R. Behtash, B. Schauwecker, F. Bourgeois, H. Jung, J. Bataille, P. Mezenge, C. Gourdon, C. Ollivier,
Microelectronics Reliability

References

YearCitations

Page 1