Transient characterization of the electroforming process in TiO2 based resistive switching devices

Abstract

The transient electroforming process of TiO2-based resistive switching devices is investigated using a pulsed voltage method, and the electroforming time is found to vary from 10−8 s to 10−1 s as function of pulse magnitude (3–8 V) and ambient temperature (25–100 °C). Pulsed experiments and thermal simulations reveal that Joule self-heating has a significant effect on the electroforming dynamics, specially for electroforming voltages above 5.5 V where there is little dependence on ambient temperature and the electroforming time (10–100 ns) is much shorter than the device thermal time constant (≈2 μs).