Journal of Computational Electronics · 2013 · 19 citations · 11 references
EngineeringElectrical EngineeringMicroelectronicsSemiconductor DevicesDevice CharacterizationIntegrated Circuit DesignLeakage Power ReductionShort-channel EffectsGate Oxide LeakageGate Oxide Thickness EffectsGate-dependent Current-voltage BehaviorLateral Power DevicesPower Mosfets
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Low on-Resistance SOI Dual-Trench-Gate MOSFET
Xiaorong Luo, Tan Fu Lei, Yan-Xiong Wang et al. · IEEE Transactions on Electron Devices · 2011 · 61 citations