Field-emission SEM imaging of compositional and doping layer semiconductor superlattices - Concepedia

Concepedia

Publication | Closed Access

Field-emission SEM imaging of compositional and doping layer semiconductor superlattices

178

Citations

7

References

1995

Year

D. D. Perovic, Martin R. Castell, A. Howie, C. Lavoie, T. Tiedje, Jorden Cole

Ultramicroscopy

Materials ScienceEngineeringApplied PhysicsField-emission Sem ImagingSemiconductor MaterialMolecular Beam EpitaxyCompound SemiconductorSemiconductor Nanostructures

References

	Year	Citations

Page 1