Winfried Mönch

Barrier heights of real Schottky contacts explained by metal-induced gap states and lateral inhomogeneities

Winfried Mönch · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1999 · 441 citations

Engineering, Electrical Engineering, Materials Science +17

Explanation of the linear correlation between barrier heights and ideality factors of real metal-semiconductor contacts by laterally nonuniform Schottky barriers

R. F. Schmitsdorf, T.U. Kampen, Winfried Mönch · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1997 · 392 citations

Engineering, Electrical Engineering, Materials Science +17

Role of virtual gap states and defects in metal-semiconductor contacts

Winfried Mönch · Physical Review Letters · 1987 · 339 citations

Engineering, Materials Science, Physics +17

On the physics of metal-semiconductor interfaces

Winfried Mönch · Reports on Progress in Physics · 1990 · 288 citations

Engineering, Electrical Engineering, Physics +17

Metal-semiconductor contacts: electronic properties

Winfried Mönch · Surface Science · 1994 · 229 citations

Engineering, Materials Engineering, Materials Science +14