T.U. Kampen

Explanation of the linear correlation between barrier heights and ideality factors of real metal-semiconductor contacts by laterally nonuniform Schottky barriers

R. F. Schmitsdorf, T.U. Kampen, Winfried Mönch · Journal of Vacuum Science & Technology B Microelectronics and Nanometer Structures Processing Measurement and Phenomena · 1997 · 392 citations

Engineering, Electrical Engineering, Materials Science +17

Correlation between barrier height and interface structure of Schottky diodes

R. F. Schmitsdorf, T.U. Kampen, Winfried Mönch · Surface Science · 1995 · 225 citations

Engineering, Electrical Engineering, Materials Science +16

Resonant Raman spectroscopy of 3,4,9,10-perylene-tetracarboxylic-dianhydride epitaxial films

Reinhard Scholz, Andrei Yu Kobitski, T.U. Kampen et al. · Physical review. B, Condensed matter · 2000 · 139 citations

Natural Sciences, Chemistry, Physics +17

Barrier height engineering of Ag/GaAs(100) Schottky contacts by a thin organic interlayer

T.U. Kampen, Suhyun Park, Dietrich R. T. Zahn · Applied Surface Science · 2002 · 135 citations

Engineering, Electrical Engineering, Materials Science +14

Lead contacts on Si(111):H-1 × 1 surfaces

T.U. Kampen, Winfried Mönch · Surface Science · 1995 · 100 citations

Natural Sciences, Materials Science, Physics +14