Journal of Electronic Materials · 2012 · 56 citations · 6 references
EngineeringMaterials EngineeringMaterials ScienceElectronic MaterialsMicroelectronicsSemiconductor DevicesAlloysDefects In Electronic MaterialsDevice ReliabilityHigh-temperature MaterialsSemiconductor Device MaterialsSemiconductor ReliabilityAlloyingHigh-temperature ElectronicsSolder Joint Residual StressSolderabilityThermal Reliability
6
Assessment of Au-Ge Die Attachment for an Extended Junction Temperature Range in Power Applications
Satoshi Tanimoto, Kohei Matsui, Yoshinori Murakami et al. · Additional Conferences (Device Packaging HiTEC HiTEN & CICMT) · 2010 · 30 citations
Natural Sciences, Materials Engineering, Materials Science +17